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Automated identification of two-dimensional crystals based on optical contrast difference
The goal of this project is to develop an automated setup that is able to identify flakes of different thicknesses on Si/SiO2 substrates by analyzing the difference in optical contrast between the crystals and
the substrate.
Two-dimensional (2D) materials have emerged as a promising class of layered materials for optoelectronic applications and discovering novel physical phenomena [1]. Different materials can be combined in heterostructures with tailored optical and electrical properties. The assembly of such devices relies on the so-called mechanical exfoliation technique that also led to the discovery of graphene. In this method, micrometer sized flakes of 2D materials are exfoliated onto silicon/silicon-oxide (Si/SiO2) substrates that enables flakes of different thickness to be distinguished easily in an optical microscope by their difference in contrast.
The goal of this project is to develop an automated setup that is able to identify flakes of different thicknesses on Si/SiO2 substrates by analyzing the difference in optical contrast between the crystals and the substrate. A software code will be developed that is capable of processing images from the optical microscope as well as controlling a hardware setup that scans the stage with the sample holder.
[1] F. Xia, et al. ”Two-dimensional material nanophotonics. Nat. Photon., Vol 8 No. 12 (2014), 899 -
907.
[2] Li, Hai, et al. ”Rapid and Reliable Thickness Identification of Two-Dimensional Nanosheets using
Optical Microscopy.” ACS Nano Vol 7 No. 11 (2013): 10344-10353.
Prerequisites: Basic knowledge of computer programming and image processing.
Two-dimensional (2D) materials have emerged as a promising class of layered materials for optoelectronic applications and discovering novel physical phenomena [1]. Different materials can be combined in heterostructures with tailored optical and electrical properties. The assembly of such devices relies on the so-called mechanical exfoliation technique that also led to the discovery of graphene. In this method, micrometer sized flakes of 2D materials are exfoliated onto silicon/silicon-oxide (Si/SiO2) substrates that enables flakes of different thickness to be distinguished easily in an optical microscope by their difference in contrast. The goal of this project is to develop an automated setup that is able to identify flakes of different thicknesses on Si/SiO2 substrates by analyzing the difference in optical contrast between the crystals and the substrate. A software code will be developed that is capable of processing images from the optical microscope as well as controlling a hardware setup that scans the stage with the sample holder.
[1] F. Xia, et al. ”Two-dimensional material nanophotonics. Nat. Photon., Vol 8 No. 12 (2014), 899 - 907. [2] Li, Hai, et al. ”Rapid and Reliable Thickness Identification of Two-Dimensional Nanosheets using Optical Microscopy.” ACS Nano Vol 7 No. 11 (2013): 10344-10353.
Prerequisites: Basic knowledge of computer programming and image processing.
Each year the IDEA League offers the students of its partner universities over 180 monthly grants for a short-term research exchange. In general, these grants are awarded based on academic merit. For more information visit http://idealeague.org/student-grant/